演讲嘉宾-于广辉

于广辉
中科院上海微系统与信息技术研究所研究员
演讲题目:(Oral) Wrinkle-dependent Hydrogen Etching of Chemical Vapor Deposition-grown Graphene
主题会场
开始时间
结束时间
内容摘要

Hydrogen etching properties of graphene domains and films grown on copper (Cu) foil via chemical vapor deposition and were studied. Numerous trenches were observed on the initial graphene domains after etching, and the trench patterns were closely associated with the Cu crystal orientation. The distribution of trenches is also related with the Cu surface reconstruction observed after cooling down to RT, and the winkles density can be reduced by increasing the coverage of Cu reconstruction areas.  No trenches were found if the etching process was conducted before cooling down. The etching trenches were bound up with the wrinkles formed during the cooling down process. Hydrogen etching provides a convenient way to detect the distribution and morphology of wrinkles in graphene.

关于主办方

联系我们
400-110-3655   

E-mail: meeting@c-gia.cn   meeting01@c-gia.cn

参展电话:13646399362(苏老师)

主讲申请:19991951101(王老师)

官方微信订阅号
Copyright © 中国国际石墨烯创新大会 版权所有     运营机构:北京现代华清材料科技发展有限责任公司
grapchina.org 京ICP备10026874号-12   grapchina.cn 京ICP备10026874号-23
京公网安备 11010802023402号
分享到:
凯发_于广辉

凯发

演讲嘉宾-于广辉

于广辉
中科院上海微系统与信息技术研究所研究员
演讲题目:(Oral) Wrinkle-dependent Hydrogen Etching of Chemical Vapor Deposition-grown Graphene
主题会场
开始时间
结束时间
内容摘要

Hydrogen etching properties of graphene domains and films grown on copper (Cu) foil via chemical vapor deposition and were studied. Numerous trenches were observed on the initial graphene domains after etching, and the trench patterns were closely associated with the Cu crystal orientation. The distribution of trenches is also related with the Cu surface reconstruction observed after cooling down to RT, and the winkles density can be reduced by increasing the coverage of Cu reconstruction areas.  No trenches were found if the etching process was conducted before cooling down. The etching trenches were bound up with the wrinkles formed during the cooling down process. Hydrogen etching provides a convenient way to detect the distribution and morphology of wrinkles in graphene.

关于主办方

联系我们
400-110-3655   

E-mail: meeting@c-gia.cn   meeting01@c-gia.cn

参展电话:13646399362(苏老师)

主讲申请:19991951101(王老师)

官方微信订阅号
Copyright © 中国国际石墨烯创新大会 版权所有     运营机构:北京现代华清材料科技发展有限责任公司
grapchina.org 京ICP备10026874号-12   grapchina.cn 京ICP备10026874号-23
京公网安备 11010802023402号
分享到: