演讲题目:Metrology for Graphene: Characterisation and Standardisation for an Emerging Industry
内容摘要
Graphene has already demonstrated that is can be used to the benefit of metrology as a new quantum standard for resistance [1]. However, there are many application areas where graphene and other 2-D materials may be disruptive, areas such as flexible electronics, nanocomposites, sensing, filtration membranes and energy storage [2]. Applying metrology to the area of graphene is now paramount to enable the emerging global graphene industry and bridge the gap between academia and industry. Measurement capabilities and expertise for a wide range of scientific areas are required to address this challenge. The combined and complementary approach of varied characterisation methods for structural, chemical and electrical properties, will allow the real-world issues of commercialising graphene and other 2-D materials, such as determining the suitability and realistic performance enhancement of graphene-enabled products for the many different types of graphene.
As the UK’s leading National Measurement Institute (NMI), the National Physical Laboratory (NPL) is uniquely positioned to enable the commercialisation of graphene through the application of metrology in this area. Examples of metrology challenges that have been overcome using both established and emerging measurement techniques will be discussed, highlighting the cross-disciplinary research and collaboration with both academia and industry. Particularly, the characterisation of the structural and chemical properties of graphene and related 2-D materials via techniques such as Raman spectroscopy, tip-enhanced Raman spectroscopy (TERS) and secondary ion mass spectrometry (SIMS) will be detailed. In addition, how these metrology investigations ultimately lead to the development of international graphene standards will also be described.