演讲嘉宾-Andrew J. Pollard

Andrew J. Pollard
英国国家物理实验室(NPL)教授

Andrew Pollard于2005年在诺丁汉大学获得物理硕士学位,并于2010年在诺丁汉大学彼得·贝特教授的纳米科学组完成他的博士论文。Andrew Pollard之前的工作包括开发超真空下的AFM-STM系统,在超真空下过渡金属表面制备单层石墨烯,并利用STM进行表面研究。

2009年进入英国国家物理实验室后,Andrew一直领导表面和纳米分析课题组从事石墨烯、其他类石墨烯先进二维材料和相关器件的测量。计量主要是利用一系列表面表征技术对材料进行实际测量,如拉曼光谱和针尖增强拉曼光谱技术拉曼光谱(TERS)、扫描探测显微镜(SPM)、二次离子质谱(SIMS)、X射线光电子能谱(XPS)和椭偏。Andrew也参与了新兴的石墨烯产业化组织,为该领域在标准和检测方面提供指导意见,是石墨烯利益相关方联合协会(GSA)的咨询委员会成员。

Andrew主要研究领域:

石墨烯及石墨烯纳米器件的测量;

石墨烯及先进二维材料的表征;

石墨烯和二维材料的国际标准

演讲题目:Metrology for Graphene: Characterisation and Standardisation for an Emerging Industry
主题会场E 石墨烯标准化论坛
开始时间
结束时间
内容摘要

Graphene has already demonstrated that is can be used to the benefit of metrology as a new quantum standard for resistance [1]. However, there are many application areas where graphene and other 2-D materials may be disruptive, areas such as flexible electronics, nanocomposites, sensing, filtration membranes and energy storage [2]. Applying metrology to the area of graphene is now paramount to enable the emerging global graphene industry and bridge the gap between academia and industry. Measurement capabilities and expertise for a wide range of scientific areas are required to address this challenge. The combined and complementary approach of varied characterisation methods for structural, chemical and electrical properties, will allow the real-world issues of commercialising graphene and other 2-D materials, such as determining the suitability and realistic performance enhancement of graphene-enabled products for the many different types of graphene.
As the UK’s leading National Measurement Institute (NMI), the National Physical Laboratory (NPL) is uniquely positioned to enable the commercialisation of graphene through the application of metrology in this area. Examples of metrology challenges that have been overcome using both established and emerging measurement techniques will be discussed, highlighting the cross-disciplinary research and collaboration with both academia and industry. Particularly, the characterisation of the structural and chemical properties of graphene and related 2-D materials via techniques such as Raman spectroscopy, tip-enhanced Raman spectroscopy (TERS) and secondary ion mass spectrometry (SIMS) will be detailed. In addition, how these metrology investigations ultimately lead to the development of international graphene standards will also be described.

关于主办方

联系我们
400-110-3655   

E-mail: meeting@c-gia.cn   meeting01@c-gia.cn

参展电话:13646399362(苏老师)

主讲申请:19991951101(王老师)

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Copyright © 中国国际石墨烯创新大会 版权所有     运营机构:北京现代华清材料科技发展有限责任公司
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凯发_Andrew J. Pollard

凯发

演讲嘉宾-Andrew J. Pollard

Andrew J. Pollard
英国国家物理实验室(NPL)教授

Andrew Pollard于2005年在诺丁汉大学获得物理硕士学位,并于2010年在诺丁汉大学彼得·贝特教授的纳米科学组完成他的博士论文。Andrew Pollard之前的工作包括开发超真空下的AFM-STM系统,在超真空下过渡金属表面制备单层石墨烯,并利用STM进行表面研究。

2009年进入英国国家物理实验室后,Andrew一直领导表面和纳米分析课题组从事石墨烯、其他类石墨烯先进二维材料和相关器件的测量。计量主要是利用一系列表面表征技术对材料进行实际测量,如拉曼光谱和针尖增强拉曼光谱技术拉曼光谱(TERS)、扫描探测显微镜(SPM)、二次离子质谱(SIMS)、X射线光电子能谱(XPS)和椭偏。Andrew也参与了新兴的石墨烯产业化组织,为该领域在标准和检测方面提供指导意见,是石墨烯利益相关方联合协会(GSA)的咨询委员会成员。

Andrew主要研究领域:

石墨烯及石墨烯纳米器件的测量;

石墨烯及先进二维材料的表征;

石墨烯和二维材料的国际标准

演讲题目:Metrology for Graphene: Characterisation and Standardisation for an Emerging Industry
主题会场E 石墨烯标准化论坛
开始时间
结束时间
内容摘要

Graphene has already demonstrated that is can be used to the benefit of metrology as a new quantum standard for resistance [1]. However, there are many application areas where graphene and other 2-D materials may be disruptive, areas such as flexible electronics, nanocomposites, sensing, filtration membranes and energy storage [2]. Applying metrology to the area of graphene is now paramount to enable the emerging global graphene industry and bridge the gap between academia and industry. Measurement capabilities and expertise for a wide range of scientific areas are required to address this challenge. The combined and complementary approach of varied characterisation methods for structural, chemical and electrical properties, will allow the real-world issues of commercialising graphene and other 2-D materials, such as determining the suitability and realistic performance enhancement of graphene-enabled products for the many different types of graphene.
As the UK’s leading National Measurement Institute (NMI), the National Physical Laboratory (NPL) is uniquely positioned to enable the commercialisation of graphene through the application of metrology in this area. Examples of metrology challenges that have been overcome using both established and emerging measurement techniques will be discussed, highlighting the cross-disciplinary research and collaboration with both academia and industry. Particularly, the characterisation of the structural and chemical properties of graphene and related 2-D materials via techniques such as Raman spectroscopy, tip-enhanced Raman spectroscopy (TERS) and secondary ion mass spectrometry (SIMS) will be detailed. In addition, how these metrology investigations ultimately lead to the development of international graphene standards will also be described.

关于主办方

联系我们
400-110-3655   

E-mail: meeting@c-gia.cn   meeting01@c-gia.cn

参展电话:13646399362(苏老师)

主讲申请:19991951101(王老师)

官方微信订阅号
Copyright © 中国国际石墨烯创新大会 版权所有     运营机构:北京现代华清材料科技发展有限责任公司
grapchina.org 京ICP备10026874号-12   grapchina.cn 京ICP备10026874号-23
京公网安备 11010802023402号
分享到: