演讲嘉宾-Mun Seok Jeong

Mun Seok Jeong
韩国成均馆大学
 Mun Seok Jeong 2000年从韩国全北国立大学取得博士学位。2000至2001年,他在伊利诺伊大学厄巴纳―香槟分校从事博士后研究。在电子通信研究院做了两年的高级研究员之后,他于2003年加入了光州科学技术院(GIST)的先进光子学研究所(APRI)。2013年起,他在韩国成均馆大学担任副教授,他的研究兴趣主要集中在显微镜下纳米结构的时空分辨光谱研究。从2005年起他一直是ISO TC229和IEC TC113专家委员会的委员。现在,他是IEC TC113项目组的组长,负责石墨烯层号评价方法标准化的定制。
演讲题目:Evaluation of the number of layers of Graphene
主题会场E  石墨烯标准化论坛
开始时间
结束时间
内容摘要

Graphene attracted a great interest as a nextgeneration electronic material, due to its good conductivity and mobility. Ithas been regarded more advantageous than carbon nanotube (CNT) becauseelectronic properties are isotropic and homogeneous compared to CNT. Manycompanies are providing graphene samples to research fields and to industry byvarious method as chemical vapor deposition (CVD) or mechanical exfoliation.Here, both for research point-of-view and industrial point-of-view, definingand judging the number of layers of fabricated graphene is critical.Unfortunately, there are no commonly accepted standard so far, which prevents areliable production and further expansion of applications. There are number ofmethods which is used to define the number of graphene layers such as atomicforce microscopy(AFM), transmittance, and Raman scattering. Those methods arebeneficial in certain aspects, however, none of them gives a precise measure ofnumber of layer or is not applicable in industry. In this talk, standardizationactivity about evaluation method of layer number of graphene will be provided. 

关于主办方

联系我们
400-110-3655   

E-mail: meeting@c-gia.cn   meeting01@c-gia.cn

参展电话:13646399362(苏老师)

主讲申请:19991951101(王老师)

官方微信订阅号
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凯发_Mun Seok Jeong

凯发

演讲嘉宾-Mun Seok Jeong

Mun Seok Jeong
韩国成均馆大学
 Mun Seok Jeong 2000年从韩国全北国立大学取得博士学位。2000至2001年,他在伊利诺伊大学厄巴纳―香槟分校从事博士后研究。在电子通信研究院做了两年的高级研究员之后,他于2003年加入了光州科学技术院(GIST)的先进光子学研究所(APRI)。2013年起,他在韩国成均馆大学担任副教授,他的研究兴趣主要集中在显微镜下纳米结构的时空分辨光谱研究。从2005年起他一直是ISO TC229和IEC TC113专家委员会的委员。现在,他是IEC TC113项目组的组长,负责石墨烯层号评价方法标准化的定制。
演讲题目:Evaluation of the number of layers of Graphene
主题会场E  石墨烯标准化论坛
开始时间
结束时间
内容摘要

Graphene attracted a great interest as a nextgeneration electronic material, due to its good conductivity and mobility. Ithas been regarded more advantageous than carbon nanotube (CNT) becauseelectronic properties are isotropic and homogeneous compared to CNT. Manycompanies are providing graphene samples to research fields and to industry byvarious method as chemical vapor deposition (CVD) or mechanical exfoliation.Here, both for research point-of-view and industrial point-of-view, definingand judging the number of layers of fabricated graphene is critical.Unfortunately, there are no commonly accepted standard so far, which prevents areliable production and further expansion of applications. There are number ofmethods which is used to define the number of graphene layers such as atomicforce microscopy(AFM), transmittance, and Raman scattering. Those methods arebeneficial in certain aspects, however, none of them gives a precise measure ofnumber of layer or is not applicable in industry. In this talk, standardizationactivity about evaluation method of layer number of graphene will be provided. 

关于主办方

联系我们
400-110-3655   

E-mail: meeting@c-gia.cn   meeting01@c-gia.cn

参展电话:13646399362(苏老师)

主讲申请:19991951101(王老师)

官方微信订阅号
Copyright © 中国国际石墨烯创新大会 版权所有     运营机构:北京现代华清材料科技发展有限责任公司
grapchina.org 京ICP备10026874号-12   grapchina.cn 京ICP备10026874号-23
京公网安备 11010802023402号
分享到: